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Quick and Easy
I-V Testing
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Modular I-V Test with
Parametric Extraction
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Turnkey Semiconductor Characterization
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Keithley
Curve-Tracer Solutions:
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Built-in Interactive I-V Web Interface (TSP Express) in Series 2600A SourceMeters
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ACS Basic Edition Software; and, Series 2600A
or
Series 2400
SourceMeter instruments
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4200-SCS with KITE
for Fully Integrated I-V Characterization, with C-V and Pulse Capabilities
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Functionality
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Linear/Log sweeps, pulse, custom sweeps, single-point source-measures.
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Uses Series 2600A’s new Application Programming Interface for precision timing and channel synchronization.
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Applications range from early device research through development, quality verification, and failure analysis
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100 built-in parametric characterizations quickly provide the information needed to verify a component’s performance vs. its specifications.
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Lab grade DC, CV and pulse device characterization, real-time plotting, and analysis with high precision and sub-femtoamp resolution.
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Features
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TSP Express Software is embedded in the internal LXI web page of all Series 2600A instruments
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Easy access to instrument functionality via pre-configured test modules
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Data can be viewed in graphical or tabular formats and can be readily exported to a “.csv” file
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Simplified user interface that eliminates confusing test jargon
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Single- and multi-test modes
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Rich set of easy-to-access test libraries
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Quick comparisons of results with saved data
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Script editor
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Complete database archive with full formulator, graph, and sheet
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Quick test setup leads to results faster
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No programming necessary, resulting in reduced test development time and cost savings
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Unique Remote PreAmps extend the resolution of SMUs to 0.1fA
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New pulse, pulse I-V, and C-V capabilities for advanced semiconductor testing
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New scope card provides integrated scope and pulse measure functionality
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Self-contained PC provides fast test setup, powerful data analysis, graphing and printing, and on-board mass storage of test results
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Typical Users
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Technicians, graduate assistants, chemists, physicists, or others who are not test experts
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Technicians, graduate assistants, chemists, physicists, or others who are not test experts
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Labs involved in semiconductor product development
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Incoming inspection and QA group
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Researchers investigating the properties of novel devices
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Semiconductor Researchers
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Reliability Engineers
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Die Sort Engineers
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Process Development Engineers
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