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Parametric Analyzers
ACS Basic Edition

  • Semiconductor component characterization
  • Failure analysis
  • Easily adapted to new technology applications
  • Library of hundreds of standard device tests
  • Supports full range of Keithley SourceMeter instruments and more
4200-SCS Semiconductor Parameter Analyzer

  • Intuitive Windows based user interface
  • Single instrument solution
  • I-V, C-V and pulse generation, and pulse I-V
  • Application libraries included for every technology
 
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1-800-935-5595 (US Only)