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Semiconductor Characterization Software
Our Automated Characterization Suite (ACS) software offers powerful solutions for automating semiconductor characterization at the device, wafer, or cassette level. ACS Integrated Test Systems fill the gap between interactive lab-based tools and high-speed production test tools. ACS Basic Edition is optimized for bench-top parametric testing of component and discrete (packaged) semiconductor devices, maximizing the productivity of technicians and engineers in R&D. ACS-WLR (Wafer Level Reliability) Integrated Test Systems allow the creation of lifetime predictions from two to five times faster than do conventional WLR test solutions, accelerating technology development, process integration, and process monitoring for faster time to market.
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ACS Systems
Automated Characterization Suite (ACS) Test Systems
  • All-in-one solution: from test setup to analyzing results
  • Compatible with popular fully automatic probers
  • Intuitive GUI
  • No coding needed–even for multi test characterization
  • Script editor for specialized test development
  • Easy-to-use applications library
  • For benchtop and automated rack-based systems
ACS Basic Edition
Model ACS Basic Edition Automated Characterization Suite for Component Characterization
  • Semiconductor component characterization
  • Failure analysis
  • Easily adapted to new technology applications
  • Library of hundreds of standard device tests
  • Supports full range of Keithley SourceMeter instruments and more
ACS for WLR
Automated Characterization Suite (ACS) Test Systems
  • Interactive interface optimized for parallel SMU-per-pin testing
  • Compliant with most JEDEC standard test methods
  • Powerful and flexible stress/measure sequencing capability
  • Formulator for parameter analysis and line fits
  • Monitor real-time test results
 
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1-800-935-5595 (US Only)