• All-in-one solution: from test setup to analyzing results
  

• Compatible with popular fully automatic probers
  

• Intuitive GUI
  

• No coding needed–even for multi test characterization
  

• Script editor for specialized test development
  

• Easy-to-use applications library
  

• For benchtop and automated rack-based systems
  

• Semiconductor component characterization
  

• Failure analysis
  

• Easily adapted to new technology applications
  

• Library of hundreds of standard device tests
  

• Supports full range of Keithley SourceMeter instruments and more
  

• Interactive interface optimized for parallel SMU-per-pin testing
  

• Compliant with most JEDEC standard test methods
  

• Powerful and flexible stress/measure sequencing capability
  

• Formulator for parameter analysis and line fits
  

• Monitor real-time test results