Keithley Instruments Inc.

PR/011: Learn More about Keithley's Third-Generation On-Wafer RF
Measurement Capability" form_title="PR/011: Learn More about Keithley's
Third-Generation On-Wafer RF Measurement Capability

Keithley's third-generation RF Option solution offers continuous, automatic, real-time monitoring of measurement quality and provides the highest quality results with the highest throughput, lowest cost of operation, and easiest use.

Click here to view a short on-line product presentation.

Please send me more information about Keithleys' on-wafer RF measurement capability, including the article, "Integrating High Frequency Capacitance Measurement for Monitoring Process Variation of Equivalent Oxide Thickness of Ultra-thin Gate Dielectrics".

Please contact me regarding a product demonstration.

Please contact me immediately regarding a free consultation for my application.

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