Keithley Extends Industry’s Fastest, Smallest, and Most Cost-Effective SMU Line
Cleveland, Ohio – February 20, 2006 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces two new additions to its Series 2600 System SourceMeter® Instruments.

Keithley Opens New Offices in Asia to Optimize Local Applications and Customer Support
Cleveland, Ohio - October 17, 2005 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, today announced significant expansions of its business presence in southeast Asia with an office expansion in Singapore and the opening of two new offices in Malaysia.

Keithley Publishes Guide to RF and Wireless Terminology
Cleveland, Ohio – October 12, 2005 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, has published "Speaking RF: Wireless Communication Terminology", a guide to understanding the vocabulary of the wireless industry.

Keithley Sponsors Weblog for RF and Telecom Test Industry
Cleveland, Ohio - September 16, 2005 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, has co-developed and sponsored the first Weblog, or Blog, designed exclusively for engineers interested in RF and wireless test.

Hamilton Receives 2005 IEEE Joseph F. Keithley Award for Outstanding Contributions in the Field of Electrical Measurement
Cleveland, Ohio – September 1, 2005 - The IEEE has named Dr. Clark A. Hamilton as the recipient of the 2005 IEEE Joseph F. Keithley Award in Instrumentation and Measurement.

Keithley Wins 19th Prestigious R&D 100 Award
Cleveland, Ohio - August 30, 2005 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announced today that it has been awarded an R&D 100 Award for its combination Model 6221 Precision AC/DC Current Source and Model 2182A Nanovoltmeter.

Keithley Introduces Interactive Troubleshooting Guide on CD
Cleveland, Ohio - August 22, 2005 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, has released a tutorial CD titled "Interactive Test & Measurement Troubleshooting Guide: How to Avoid Common Measurement Errors."

Keithley Publishes New Semiconductor Test Tutorial Handbook
Cleveland, Ohio - July 12, 2005 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, has published a semiconductor test reference handbook titled Overcoming the Measurement Challenges of Advanced Semiconductor Technologies: DC, Pulsed, and RF - from Modeling to Manufacturing.

Keithley Introduces New Pulse Measurement Solution for Semiconductor Device Characterization
Cleveland, Ohio - July 12, 2005 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces the availability of pulse generation and measurement in the Model 4200-SCS Semiconductor Characterization System.

LXI Consortium Announces Fourth Membership Meeting
Cleveland, Ohio - May 20, 2005 - The LXI Consortium, a recently formed standards organization, will hold a General Meeting and its first Interoperability Testing Session on May 24 – 25, 2005, hosted by Case Western Reserve University, in Cleveland, Ohio.

Keithley Instruments Announces Dividend
Cleveland, Ohio - May 9, 2005 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, today announced its regular quarterly cash dividend of $0.0375 per common share.

Keithley, Silver Sponsor of Nanotech 2005, Presents Three Technology Seminars during Conference
Cleveland, Ohio - May 6, 2005 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces that it will participate as a silver sponsor at the NanoTech 2005 Conference, which will be held May 9 through 10 at the Anaheim Marriott & Convention Center in Anaheim, California.

Brian J. Jackman Joins Keithley's Board of Directors
Cleveland, Ohio - May 5, 2005 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, today announced that Brian J. Jackman has been appointed to the Company's Board of Directors.

Keithley Instruments Reports 11% Sales Growth and 22% Earnings Growth for Fiscal 2005 Second Quarter
Cleveland, Ohio - April 26, 2005 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, today announced results for its fiscal 2005 second quarter that ended March 31, 2005.

Keithley Introduces New Semiconductor Reliability Test System For 65NM And Beyond
Cleveland, Ohio - April 11, 2005 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces the S510 Semiconductor Reliability Test System, a high channel count, turnkey solution for use in reliability testing and lifetime modeling of the world’s most advanced ULSI CMOS processes at the 65nm node and beyond.

Hynix Awards Keithley Repeat Multi-Million Dollar Order for S680DC/RF Semiconductor Test System for Production Testing of 300mm Wafers
Cleveland, OH - March 14, 2005 - Keithley Instruments, Inc. (NYSE: KEI), a leader in solutions for emerging measurement needs, today announced it has received a repeat multiple-system order for its S680 DC/RF Parametric Test Systems from Hynix Semiconductor, Inc., a leading Korean semiconductor manufacturer and one of the world's largest DRAM (Dynamic Random Access Memory) producers.

Keithley Introduces Family of USB Data Acquisition Solutions
Cleveland, Ohio - March 17, 2005 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, introduces the Series KUSB-3100 USB-based data acquisition (DAQ) measurement solutions.

Keithley Introduces 3RD Generation of On-Wafer RF Measurement Capability
Cleveland, Ohio - March 1, 2005 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces its third generation on-wafer RF measurement capability for semiconductor parametric production process control.

Keithley Introduces Industry's Fastest, Smallest, and Most Cost-Effective Source-Measure Units for Multi-Channel Applications
Cleveland, Ohio - March 1, 2005 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces the Series 2600 System SourceMeter® Instruments, a new platform that significantly lowers the cost of test for a wide range of electronic component producers, including silicon and compound semiconductor manufacturers.

Keithley's Model S680 Semiconductor Test System Selected by AMD Fab 36 in Germany
Cleveland, Ohio - February 2, 2005 - Keithley Instruments, Inc. (NYSE: KEI), a leader in solutions for emerging measurement needs, announced today that AMD (NYSE: AMD) has selected the Keithley Model S680 DC/RF Parametric Test System to support full production of advanced logic chips at AMD's new state-of-the-art 300mm Fab 36 located in Dresden, Germany.

Keithley Named to List of 50 Leading Electronics Companies
Cleveland, OH - January 26, 2005 - Keithley Instruments, Inc. (NYSE: KEI), a leader in solutions for emerging measurement needs, has been named in the electronics industry's annual Movers & Shakers issue as #4 on its list of Top 50 Companies to Watch in 2005.

Keithley Reports 20% Sales Growth and 156% Earnings Growth for Fiscal 2005 First Quarter
Cleveland, Ohio - January 25, 2005 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, today announced results for its fiscal 2005 first quarter that ended December 31, 2004.

Keithley Receives Prestigious Industry Awards for Innovation in Low-Level Measurement Products
Cleveland, Ohio - January 20, 2005 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, has received a "Best in Test Award" from Test and Measurement World magazine for the combination Model 6221 Precision AC/DC Current Source and Model 2182A Nanovoltmeter and a 2004 Editors' Choice Award from Control Engineering magazine for the Model 6221 Precision AC/DC Current Source.

Keithley Expands Switching Product Line with Industry's Highest Density Half-Rack Switching System
Cleveland, Ohio - January 18, 2005 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, introduces the Model 7002-HD high-density two-slot switching mainframe and cards, offering instrument grade switching at a price up to 40% less than comparable platforms.

Keithley Introduces Tutorial CD for Reliability Testing of Semiconductor Devices
Cleveland, Ohio - January 12, 2005 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, has released "Understanding Measurements: Essential Reliability Testing Techniques", an interactive, tutorial CD on reliability testing for semiconductor test engineers.

Keithley Instruments Announces Dividend
Cleveland, Ohio - December 3, 2004 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, today announced its regular quarterly cash dividend of $0.0375 per common share.

Keithley Publishes 2005 Test and Measurement Catalog
Cleveland, Ohio - November 24, 2004 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces the availability of its 2005 Test and Measurement Products Catalog.

Keithley Instruments Reports 35% Sales Growth and 49% Order Growth for Fiscal 2004 Fourth Quarter
Cleveland, Ohio - November 4, 2004 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, today announced results for its fourth quarter and year that ended September 30, 2004.

Yuegang Zhao to Present at International Solid-State and Integrated-Circuit Technologies Conference
Cleveland, Ohio - October 15, 2004 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, today announced that Yuegang Zhao will orally present his paper "Effective Minimization of Charge Trapping in High-k Gate Dielectrics with an Ultra-short Pulse Technique" at the 7th International Conference on Solid-State and Integrated-Circuit Technology (ICSICT).

Keithley Releases USB-to-GPIB Interface Adapter
Cleveland, Ohio - October 12, 2004 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces the Model KUSB-488 USB-to-GPIB Interface Adapter, which transforms any computer with a USB port into a full-function, IEEE 488.2 controller that can control up to 14 programmable GPIB instruments.

Linda Rae to Give Keynote at EOEM Design Online Expo
Cleveland, Ohio - October 12, 2004 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces that Senior Vice President and General Manager Linda Rae will give the keynote address titled "Best in Test: How World Class Organizations Rely on Testing To Make Better Products" at the 2nd annual EOEM Design Online Expo.

LXI Consortium to be Joined by Keithley Instruments
PALO ALTO, Calif. - October 12, 2004 - The LXI Consortium today announced that Keithley Instruments Inc. (NYSE: KEI) will join the recently formed standards organization.

Keithley Low Level Measurements Handbook Contains Tutorial for Accurate, Sensitive Measurements
Cleveland, Ohio - October 6, 2004 - Keithley Instruments, Inc. (NYSE: KEI), a leader in solutions for emerging measurement needs, has published an updated version of its popular reference book titled, "Low Level Measurements Handbook: Precision DC Current, Voltage, and Resistance Measurements".

Barbara V. Scherer Joins Keithley's Board of Directors
Cleveland, OH - September 3, 2004 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, today announced that Barbara V. Scherer has been appointed to the Company's Board of Directors.

Keithley Receives Order for Multiple S680 Parametric Test Systems from Leading Korean Fab
Cleveland, OH - September 1, 2004 - Keithley Instruments, Inc. (NYSE: KEI), a leader in solutions for emerging measurement needs, today announced it has received a multi-fab, multiple-system order from a leading Korean semiconductor manufacturer for its S680 DC/RF Parametric Test System.

Keithley Reports Double-Digit Sales and Order Growth for Fiscal 2004 Third Quarter
Cleveland, OH - July 23, 2004 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, today announced results for its fiscal 2004 third quarter that ended June 30, 2004.

Keithley Launches Model 2182A Nanovoltmeter for Eliminating Noise in Low Voltage Measurements
Cleveland, OH - July 14, 2004 - Keithley Instruments, Inc. (NYSE:KEI) today introduced its Model 2182A Nanovoltmeter, which is optimized for making low noise measurements in research, metrology, nanotechnology, superconductivity, and other low voltage/resistance applications.

Keithley Introduces Ready-to-Run 200mm Wafer Test System for 130nm Node and Beyond
Cleveland, OH - July 14, 2004 - Keithley Instruments, Inc. (NYSE:KEI) has developed a packaged, ready-to-run parametric test system with unrivaled cost-per-pin and total price/performance ratio.

Keithley Releases Precision DC AND AC/DC Current Sources
Cleveland, OH - July 14, 2004 - Keithley Instruments, Inc. (NYSE:KEI today introduced its Model 6221 AC and DC Current Source and Model 6220 DC Current Source. The Model 6221 is the industry's only AC current source on the market

Keithley Expands RF Measurement Capability to GSM Transmitter Modulation Quality Measurements
Cleveland, OH - July 7, 2004 - Keithley Instruments, Inc. today added an option for making GSM transmitter quality modulation measurements to its Model 2800 RF Power Analyzer.

Keithley Creates How-To Temperature Measurements CD
Cleveland, OH - June 8, 2004 - Keithley Instruments, Inc. today announced that it is releasing an interactive, tutorial CD on making accurate temperature measurements.

American Physical Society Presents 2004 Joseph F. Keithley Award for Advances in Measurement Science
Cleveland, OH - June 8, 2004 - The American Physical Society (APS) named Virgil Bruce Elings of NanoDevices as the 2004 winner of the Joseph F. Keithley Award for his development of scanning probe microscopy.

Hall Receives 2004 IEEE Joseph F. Keithley Award for Contributions to Electrical Measurements Field
Cleveland, OH - June 8, 2004 - The IEEE has named Henry P. Hall as the recipient of the 2004 IEEE Joseph F. Keithley Award in Instrumentation and Measurement for his seminal contributions to the development of impedance bridges and standards and to the application of microprocessors to impedance measurement science.

Keithley Publishes Four Step Error Checker Poster
Cleveland, OH - May 18, 2004 - Keithley Instruments, Inc. has announced availability of its Four Step Error Checker Poster that offers guidance to engineers and scientists for avoiding common low-level measurement errors.

Keithley Instruments Announces Dividend
Cleveland, OH - May 17, 2004 - Keithley Instruments, Inc. today announced its regular quarterly cash dividend of $0.0375 per common share.

Keithley Instruments Reports Strong Results for Fiscal 2004 Second Quarter
Cleveland, OH - April 28, 2004 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, today announced results for its fiscal 2004 second quarter that ended March 31, 2004.

Keithley Enters Agreement to Distribute Elgar Power Supplies in Asia
Cleveland, OH - April 2, 2004 - Keithley Instruments, Inc. has signed an agreement with Elgar Electronics Corporation, San Diego, CA, to sell, service, and support the full line of Elgar programmable power supplies through Keithley's sales and support offices located throughout China, Taiwan, and Japan.

Keithley Creates Measurement How-To Library on CD
Cleveland, OH - March 25, 2004 - Keithley Instruments, Inc. today announced that it is releasing a tutorial CD containing a collection of its on-line seminars on measurement methods. Keithley's Making Measurements with Confidence CD is available free of charge.

Keithley Releases Free Measurement Software Toolkit for Nanotech Researchers
Cleveland, OH - March 3, 2004 - Keithley Instruments, Inc. (NYSE:KEI) has developed a Nanotech Toolkit, a set of measurement software tools designed specifically for a variety of tests common to nanotechnology researchers to assist them in making the very precise, often complex electrical measurements associated with nanotechnology.

Keithley Instruments Announces Nanotech Partnership with The SUNY-Albany Nanotech Center
Albany, NY - February 3, 2004 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, today announced that it is partnering with the Albany NanoTech Center at the University at Albany-State University of New York (SUNY) to share research information and work together to further the understanding of nanotechnology and optoelectronics technologies.