NanoTech 2005

Show Dates: May 9-10, 2005
Location: Anaheim, CA
Facility: Anaheim Marriott & Convention Center
Booth Number: 407

Nanotech is the largest Nanotechnology conference in the world providing collaborative direction to the growing community of nano science, technology and business. The Nanotech conference and tradeshow is the premier industry event on nanotechnology. The conference will showcase more than five hundred technology presentations, government program reviews and will feature an IP showcase and new vertical industry symposia.

In addition to our very sensitive measurement tools, Keithley also offers a variety of measurement equipment that researchers will find to be very cost-effective with all the quality expected from us.  These tools, on display, include the powerful 4200 characterization system and the new 6221/2182A AC/DC Current Source/Nanovoltmeter combination for measuring low resistances and for making differential conductance measurements on materials.  Keithley will show its end-to-end solution for circuit model development and verification. Keithley's 3rd-Generation RF Option for the S680 and S470 parametric testers solves an ITRS modeling Difficult Challenge by delivering production quantities of lab-quality DC and RF data. This enables labs and modeling groups to acquire statistically-significant amounts of data in hours not months to verify RF circuit models to 40GHz.  Keithley experts will be on hand to discuss your measurement needs and challenges, and to demonstrate the company's materials research solutions.

Join us in Anaheim for a Lunch-and-Learn Event on
Techniques for Nanoscale Devices

Attend this lunch-and-learn event and learn about techniques for Nanoscale Devices. Two presentations will include:

Advances in Probing State-of-the-Art Transistors and Other Nanoscale Devices
Presenter: Taylor Cavanah, Physicist; Technical Sales for NanoWorks Tools, Zyvex Corporation

This talk will discuss some of the reasons why the IC industry is interested in probing individual transistors that are in-die rather than the usual test transistors that are in the saw-street between die.  We will also cover some of the challenges to be overcome for reliable device data to be taken and the advantages of the Keithley-Zyvex system for this application.  Outside of the IC industry there is a growing need for probing nanoscale devices that will also be addressed.

Electrical Measurement Techniques for Nanoscale Devices using Semiconductor Characterization Systems
Presenter: Jonathan Tucker, Lead Industry Consultant, Keithley Instruments

The science of nanotechnology, by its extended variety of applications, is driving researchers to develop new materials and components using carbon nanotubes, chemical molecules, quantum dots, and even polymers. Characterizing these nanoscale components and materials is nontrivial, as many exhibit low current, low resistance, high resistance, and low power electrical properties. This presentation will offer insight into electrical measurements required for nanotechnology, with examples given for carbon nanotube-based materials and electronics, molecular electronics, and materials. The sources of measurement uncertainty that affect such sensitive measurements will be discussed, together with a discussion of using Semiconductor Device Characterizations Systems to make measurements.

Date: Monday, May 9, 2005
Time: 12:00 noon to 1:30PM 
Location: Anaheim Marriott, Veranda Room  

For attending, you'll receive at no charge a USB flash drive and a packet of material containing Keithley's nanoscale web seminar, as well as other useful information.

Click here to sign up to attend!

Need to Measure Robust Compact Models?
Attend Our Lunch-and Learn Event and
Discover New Approaches to
Measurement Requirements for Robust Compact Models

As the mainstream MOS technology is scaled into the nanometer regime, development of a truly physical and predictive compact model for circuit simulation that covers geometry, bias, temperature, DC, AC, RF, and noise characteristics becomes a major challenge.  This presentation will describe how to successfully apply accurate, robust and traceable measurement technology to the implementation of these models.

Presenter: Carl Scharrer, Senior Industry Marketing Manager
Date: Wednesday, May 11, 2005
Time: 12:00 noon to 1:30PM 
Location: Anaheim Marriott, Veranda Room  

For attending, you'll receive at no charge a USB flash drive containing useful materials related to compact modeling measurements.

Click here to sign up to attend!

In-Booth Demonstrations of Keithley Products will include:

• IV Characterization of Semiconductor and Nanoscale Electronics and Components featuring Newly Enhanced Model 4200-SCS. 
• Model 6221 AC and DC Current Source with Model 2182A Nanovoltmeter.

Literature related to these Keithley Products:

• Model 4200-SCS  literature
• Model 6221 AC and DC Current Source  literature
• Model 2182A Nanovoltmeter  literature

To register for the Nanotech Conference: click here

General Show Information: click here