How to Optimize Laser Diode Parametric Test Throughput

Available on demand 
View the presentation. 


This web-based seminar describes considerations in optimizing accuracy and throughput of DC laser diode parametric test.

This seminar is designed as an introductory course. By participating in the seminar, you'll learn:

• Where in the manufacturing process L-I-V testing is typically performed
• Drive current step size considerations
• ADC type considerations
• Optical detector head considerations
• Value of test synchronization and automation hooks
• Possible solutions

The seminar is presented by Paul Meyer, a Product Marketer in the Optoelectronics Component Test Group at Keithley Instruments, Inc.