Keithley Instruments Inc. - Online Seminar Registration Forms

Understanding Reliability Testing of Semiconductor Devices Available on demand

This seminar is available in English, Chinese, or Japanese language versions.

This seminar discusses the need for and implementation of stress-measure reliability testing in leading-edge semiconductor development. Examples of common tests and techniques currently used to guarantee reliable devices and manufacturing are given, with underlying failure mechanisms explained.

In this seminar you will learn and understand:

Relevance and importance of stress-measure testing in semiconductor design
Common stress-measure tests and techniques in use today
Failure mechanisms and their relative importance
Measurement solutions used for stress-measure testing

This seminar is recommended for Semiconductor Device and Process Engineers who wish to gain a better understanding of the effects of degradation on modern device lifetimes.

Dave Rubin, Senior Industry Market Manager, presents the seminar.

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