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UPCOMING EVENTS

2011 NCSLI • NCSL International 50th Anniversary Celebration
National Harbor, MD • USA
August 22-24, 2011
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ICSCRM 2011
International Conference on Silicon Carbide and Related Materials
Cleveland, OH • Renaissance Cleveland Hotel
September 12-16, 2011
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MRS Materials Research Society FALL
Boston, MA • USA
Nov. 28-Dec. 2, 2011
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Optoelectronics

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Keithley offers a wide range of test solutions for companies developing and manufacturing optoelectronic components and subassemblies for telecommunications, data communications, high performance illumination, and other optical applications. Keithley test products deliver speed, resolution, and accuracy – critical for making quick and informed decisions related to product design, production yield, process monitoring, specification claims, and calibration data. The results are lower manufacturing costs, improved product quality, and shorter time-to-market through improved testing of laser diodes, photo diodes, optical amplifiers, LEDs, CD/DVD lasers, and other active optoelectronic devices. Keithley’s integrated solutions combine SourceMeter® instruments, sensitive multi-channel current meters, temperature controllers, optical switching, integrating spheres, and related test equipment for full device testing and characterization. These solutions are scalable from single-channel instruments through high-density card/chassis systems. They all provide excellent ROI in high throughput parallel test environments, and when testing multi-section devices such as tunable lasers.