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UPCOMING EVENTS

2011 NCSLI • NCSL International 50th Anniversary Celebration
National Harbor, MD • USA
August 22-24, 2011
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ICSCRM 2011
International Conference on Silicon Carbide and Related Materials
Cleveland, OH • Renaissance Cleveland Hotel
September 12-16, 2011
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MRS Materials Research Society FALL
Boston, MA • USA
Nov. 28-Dec. 2, 2011
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Flat Panel Displays

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The critical measurement needs of today's high performance LCD and OLED based displays are well served by Keithley's low current, high precision source and measurement instruments. Keithley incorporates these instruments into standard and customized test systems for FPD researchers and manufacturers striving to develop new materials, optimize production processes, increase yields, and improve the reliability of new display devices. The measurement performance of each Keithley system is tailored to a specific display device technology, such as active or passive matrix LCD, amorphous or low-temperature polysilicon TFTs, polymer and small molecule PLEDs and OLEDs, as well as other emerging technologies.