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UPCOMING EVENTS

2011 NCSLI • NCSL International 50th Anniversary Celebration
National Harbor, MD • USA
August 22-24, 2011
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ICSCRM 2011
International Conference on Silicon Carbide and Related Materials
Cleveland, OH • Renaissance Cleveland Hotel
September 12-16, 2011
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MRS Materials Research Society FALL
Boston, MA • USA
Nov. 28-Dec. 2, 2011
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Component Manufacturing

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Keithley test systems for active and passive components meet electronic manufacturers’ needs for production quality measurements with superior repeatability. These manufacturers rely on Keithley for automated, high-volume production test instruments designed for in-process and end-of-line acceptance testing. Keithley’s high-speed test instruments combine measurement precision with intelligent automation capabilities that help improve yields while reducing test bottlenecks.